6533b823fe1ef96bd127f48c
RESEARCH PRODUCT
MBU characterization of NAND-Flash memories under heavy-ion irradiation
Veronique Ferlet-cavroisD. WalterMartin HerrmannHeikki KettunenFritz GliemKai Grurmannsubject
Flash (photography)Materials sciencebusiness.industryElectrical engineeringNAND gateOptoelectronicsAngular dependencebusinessHeavy ion irradiationCharacterization (materials science)description
The angular dependence of the MBU-Cross-Section of two 8-Gbit-SLC-NAND-Flash and the orientation of the MBU-pattern has been measured.
year | journal | country | edition | language |
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2011-09-01 | 2011 12th European Conference on Radiation and Its Effects on Components and Systems |