6533b823fe1ef96bd127f48c

RESEARCH PRODUCT

MBU characterization of NAND-Flash memories under heavy-ion irradiation

Veronique Ferlet-cavroisD. WalterMartin HerrmannHeikki KettunenFritz GliemKai Grurmann

subject

Flash (photography)Materials sciencebusiness.industryElectrical engineeringNAND gateOptoelectronicsAngular dependencebusinessHeavy ion irradiationCharacterization (materials science)

description

The angular dependence of the MBU-Cross-Section of two 8-Gbit-SLC-NAND-Flash and the orientation of the MBU-pattern has been measured.

https://doi.org/10.1109/radecs.2011.6131305