6533b824fe1ef96bd1280c5c
RESEARCH PRODUCT
Influence of Twinning Microstructure of Crystals with Low Tetragonality on a X-Ray Diffraction
A. I. UstinovJean-claude NiepceFrédéric BernardL. O. Olikhovs'kasubject
Fluid Flow and Transfer ProcessesMaterials sciencetetragonal crystalMaterials Science (miscellaneous)satelliteMetals and AlloystwinsCondensed Matter PhysicsMicrostructurelcsh:QC1-999diffuse scatteringSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsCondensed Matter::Materials ScienceCrystallographyx-ray diffractionCondensed Matter::SuperconductivityX-ray crystallographyCondensed Matter::Strongly Correlated ElectronsCrystal twinninglcsh:Physicsdescription
The intensity distributions of the X-rays scattered in the tetragonal single crystal, which represent a complex of the twin domains separated by the coherent parallel boundaries, are simulated. The calculations are performed by using the Monte Carlo method within the framework of a kinematical approach. The thickness distributions of the twin domains are defined according to the geometrical, Gaussian and log normal functions. ‘Critical’ effects of the X-ray scattering are found, namely there is transformation of the tetragonal doublet into singlet or multiplet. As demonstrated, each of characteristics of the tetragonal doublet profile depends on a few parameters of the twin microstructure of a crystal and cell tetragonality as well.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2001-03-01 | Uspehi Fiziki Metallov |