6533b825fe1ef96bd1281c5e
RESEARCH PRODUCT
X-ray diffraction study of crystallographic parameters and debye temperature of c60 single crystals
J. KalnacsL. ShebanovsJ. Manikssubject
Materials scienceFullereneScatteringCrystal chemistryCondensed Matter PhysicsInorganic ChemistryCrystallographysymbols.namesakeLattice constantX-ray crystallographyMaterials ChemistrysymbolsDislocationSingle crystalDebye modeldescription
Abstract The cubic lattice parameter value a =1.41568±0.00006 nm of large size C 60 single crystal has been measured and Debye temperature T D =53.9 K from the X-ray scattering spectrum at a fixed temperature was obtained. The microhardness and dislocation structure of the crystals was examined.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2002-01-01 | Journal of Crystal Growth |