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RESEARCH PRODUCT

Comparison of total-reflection X-ray fluorescence, static and portable energy dispersive X-ray fluorescence spectrometers for art and archeometry studies

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Abstract In this paper, a Total-reflection X-ray Fluorescence (TXRF), a static and a portable Energy Dispersive X-ray Fluorescence (EDXRF) spectrometers are described. Both the equipments and the techniques employed in the field of the art and archeometry are compared. Some applications in this area are presented as well. The aim of the work is to know which spectrometer is the best suited depending on the work of art and the problem treated. The conclusion reached from the experience is that the portable EDXRF spectrometer is advisable to make “in situ” and online analysis in a multidisciplinary environment, the static EDXRF equipment is good to perform analysis on paper and metal pieces and the TXRF spectrometry is the best technique for very sensitive analysis of trace elements from micro-samples. Within the last technique, we propose to analyze the cottons used by the restorers in the different steps of the restoration process since it could be a good tool to study the composition of different layers and zones of the work of art.