6533b826fe1ef96bd1285109
RESEARCH PRODUCT
Oxygen isotopic exchange: A useful tool for characterizing oxygen conducting oxides
Marie PetitjeanCécile LalanneJacques FouletierFabrice MauvyJean-marc BassatJ.-c. GrenierGilles Cabochesubject
Oxygen transport propertiesOxygen reductionDiffusionInorganic chemistryAnalytical chemistrychemistry.chemical_elementIonic bonding02 engineering and technologyConductivity010402 general chemistryHeterogeneous catalysis01 natural sciencesOxygenCatalysisIsotope exchangeCatalysisSOFCProcess Chemistry and TechnologyMixed conducting oxides[CHIM.MATE]Chemical Sciences/Material chemistry021001 nanoscience & nanotechnology0104 chemical sciencesMembranechemistry[ CHIM.MATE ] Chemical Sciences/Material chemistry0210 nano-technologyPACS: 66.30−h (diffusion in solids); 72.60+g (mixed conductivity and conductivity transitions)description
International audience; The 18O/16O isotope exchange depth profile technique (IEDP) followed by SIMS characterizations was applied to dense membranes of pure ionic conductors and mixed ionic/electronic conducting materials. It is a very useful tool since we obtain in both cases data concerning the oxygen diffusion in the bulk and the oxygen exchange at the surface of the materials. Comparisons were done, including results concerning the role of the surface with regards to the oxygen reduction reaction. Detailed experimental and analytical processes are given.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2005-08-01 |