Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air

6533b827fe1ef96bd1286f1b

RESEARCH PRODUCT

Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air

B. J. P. Jones A. Usón Víctor H. Alvarez G. Martínez-lema R. Weiss-babai J.f.c.a. Veloso E.d.c. Freitas A.b. Redwine J. Renner F. Ballester Kevin Bailey A.d. Mcdonald K. Hafidi J. Torrent J. S. Díaz M. Martínez-vara P. Novella A. Goldschmidt J. Hauptman P. Herrero D. R. Nygren L.m.p. Fernandes J. Martín-albo J.j. Gómez-cadenas Paola Ferrario Y. Ifergan N. Yahlali T. Contreras B. Romeo L. Rogers K. Woodruff D. González-díaz Saunab Ghosh Marta Losada E. Church X. Li Lior Arazi J.m.f. Dos Santos Romain Esteve Javier Pérez J. M. Benlloch-rodríguez F.j. Mora G. Díaz S. Riordan J. Haefner C. Romo-luque C.a.o. Henriques F.p. Santos Jose Repond R. Felkai A. Simón J. Muñoz Vidal P. Lebrun J.v. Carrión C.d.r. Azevedo A.f.m. Fernandes M. Diesburg Jorge Luis Rodriguez F. Monrabal C.a.n. Conde Luis Labarga T.m. Stiegler J. Escada N. López-march B. Palmeiro C. Burch A. Laing R. Guenette J.f. Toledo S. Cárcel Roberto Gutiérrez R.d.p. Mano A. Para S. Cebrián Ana Martínez F.i.g.m. Borges M. Sorel I.j. Arnquist J.a. Hernando Morata A.l. Ferreira M. Querol C. Adams N. Byrnes R. C. Webb A. Loya Villalpando V. Herrero M. Kekic J.t. White C.m.b. Monteiro Y. Rodriguez Garcia L. Ripoll

subject

Physics - Instrumentation and Detectors FOS: Physical sciences Library science 7. Clean energy 01 natural sciences 030218 nuclear medicine & medical imaging Synthetic materials TECNOLOGIA ELECTRONICA 03 medical and health sciences 0302 clinical medicine Political science 0103 physical sciences media_common.cataloged_instance European union Instrumentation Ultraviolet radiation Mathematical Physics media_common 010308 nuclear & particles physics European research Time projection Chambers (TPC)Instrumentation and Detectors (physics.ins-det)Visible radiation Double-beta decay detectors Reflectivity Detector design and construction technologies and materials National laboratory

description

[EN] Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm We also see that the reflectance of PIFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance.

year	journal	country	edition	language
2020-11-23

10.1088/1748-0221/15/11/p11031 https://hdl.handle.net/10251/172317