6533b828fe1ef96bd12884bb
RESEARCH PRODUCT
Three-dimensional mapping and range measurement by means of projected speckle patterns.
Mina TeicherCarlos FerreiraJavier GarciaYevgeny BeidermanPascuala García-martínezZeev Zalevskysubject
Physicsbusiness.industryMaterials Science (miscellaneous)Spectral densitySpeckle noiseIndustrial and Manufacturing EngineeringSpeckle patternInterferometryOpticsElectronic speckle pattern interferometrySpatial frequencySpeckle imagingBusiness and International ManagementbusinessProjection (set theory)description
We present a novel approach for three-dimensional (3D) measurements that includes the projection of coherent light through ground glass. Such a projection generates random speckle patterns on the object or on the camera, depending if the configuration is transmissive or reflective. In both cases the spatially random patterns are seen by the sensor. Different spatially random patterns are generated at different planes. The patterns are highly random and not correlated. This low correlation between different patterns is used for both 3D mapping of objects and range finding.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2008-06-03 | Applied optics |