6533b829fe1ef96bd128a51f

RESEARCH PRODUCT

Reference-Plane Invariant Method for Measuring Electromagnetic Parameters of Materials

Jian LiGheorghe Sorin ParaoanuKari SarvalaK. Chalapat

subject

PermittivityCondensed Matter - Materials SciencePhysics - Instrumentation and DetectorsRadiationMaterials scienceStability criterionAcoustics020208 electrical & electronic engineeringPhysics::OpticsMaterials Science (cond-mat.mtrl-sci)FOS: Physical sciences020206 networking & telecommunications02 engineering and technologyDielectricInstrumentation and Detectors (physics.ins-det)Condensed Matter Physics0202 electrical engineering electronic engineering information engineeringScattering parametersMeasurement uncertaintyElectrical and Electronic EngineeringWidebandMaterial propertiesRefractive index

description

This paper presents a simple and effective wideband method for the determination of material properties, such as the complex index of refraction and the complex permittivity and permeability. The method is explicit (non-iterative) and reference-plane invariant: it uses a certain combination of scattering parameters in conjunction with group-velocity data. This technique can be used to characterize both dielectric and magnetic materials. The proposed method is verified experimentally within a frequency range between 2 to 18 GHz on polytetrafluoroethylene and polyvinylchloride samples. A comprehensive error and stability analysis reveals that, similar to other methods based on transmission/reflection measurement, the uncertainties are larger at low frequencies and at the Fabry-Perot resonances.

yearjournalcountryeditionlanguage
2010-09-22
https://dx.doi.org/10.48550/arxiv.1009.4277