6533b82afe1ef96bd128b6c0
RESEARCH PRODUCT
Computer vision profilometer: equipment and evaluation of measurements
S. Lo CastoA. LombardoV. F. RuisiE. Lo Valvosubject
Materials sciencebusiness.industryBinary imageSurfaces and InterfacesSurface finishCondensed Matter PhysicsSample (graphics)ThresholdingSurfaces Coatings and FilmsOpticsMechanics of MaterialsMaterials ChemistryComputer visionCharge-coupled deviceProfilometerCylindrical lensArtificial intelligencebusinessStylusdescription
Abstract This paper describes a new equipment that measures roughness values by a computer vision (CV) technique. Measurements carried out by a CV profilometer are also evaluated. A laser source (power 2 mW), a cylindrical lens and a charge coupled device (CCD) TV-camera with a suitable optical system form an image of the profile of the sample under inspection. This image is then transformed into a binary image by thresholding and the line that divides the bright zone from the dark zone is the sample profile. From this line the characteristic roughness values can be calculated. The roughness measurements are carried out both by the CV profilometer and a stylus profilometer on eight specimens with various degrees of finish. For each investigated parameter, a strong linear relationship exists between CV and stylus measurements.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 1991-05-01 | Wear |