6533b82dfe1ef96bd12911f3

RESEARCH PRODUCT

Magnetoelectric properties of epitaxialFe3O4thin films on (011) PMN-PT piezosubstrates

subject

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We determine the magnetic and magnetotransport properties of 33 nm thick ${\mathrm{Fe}}_{3}{\mathrm{O}}_{4}$ films epitaxially deposited by rf-magnetron sputtering on unpoled (011) ${[{\mathrm{PbMg}}_{1/3}{\mathrm{Nb}}_{2/3}{\mathrm{O}}_{3}]}_{0.68}\ensuremath{-}{[{\mathrm{PbTiO}}_{3}]}_{0.32}$ (PMN-PT) substrates. The magnetoresistance (MR), as well as the magnetization reversal, strongly depend on the in-plane crystallographic direction of the epitaxial (011) ${\mathrm{Fe}}_{3}{\mathrm{O}}_{4}$ film and strain. When the magnetic field is applied along [100], the magnetization loops are slanted and the sign of the longitudinal MR changes from positive to negative around the Verwey transition at 125 K on cooling. Along the $[01\overline{1}]$ direction, the loops are square shaped and the MR is negative above the switching field across the whole temperature range, just increasing in absolute value when cooling from 300 K to 150 K. The value of the MR is found to be strongly affected by poling the PMN-PT substrate, decreasing in the [100] direction and slightly increasing in the $[01\overline{1}]$ direction upon poling, which results in a strained film.