6533b82dfe1ef96bd1291f8b
RESEARCH PRODUCT
Phase error analysis of clipped waveforms in surface topography measurement using projected fringes
Kjell G. RobbersmyrTrond VadsethKjell J. Gåsviksubject
Signal processingProjected fringesOptical metrology3-D measurementPhase (waves)ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION02 engineering and technology01 natural sciencesGeneralLiterature_MISCELLANEOUS010309 opticssymbols.namesakeOpticsClipping (photography)0103 physical sciencesWaveformProfilometryElectrical and Electronic EngineeringPhysical and Theoretical ChemistryPhase shiftMathematicsSignal processingObservational errorbusiness.industryPhasorAstrophysics::Instrumentation and Methods for Astrophysics021001 nanoscience & nanotechnologyAtomic and Molecular Physics and OpticsFourier analysisPhasor diagramsElectronic Optical and Magnetic MaterialsVDP::Teknologi: 500Fourier transformFourier analysissymbols0210 nano-technologybusinessdescription
Abstract When working with the method of projected fringes outside the optical laboratory one often encounters the problem of uncontrollable ambient light. This might cause saturation of the camera which in turn results in clipping of the fringes. Since standard theories describing phase-shifting techniques assume the projected fringes to be purely sinusoidal, such clipping will result in measurement error. In this paper a detailed analysis of this problem is given, and relations between phase errors, the amount of fringe clipping and the number of phase steps are found. Moreover, the phase difference between the clipped and the unclipped fringes is described. This investigation is based on Fourier- and phasor analysis.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2021-03-01 |