6533b82efe1ef96bd12932cf
RESEARCH PRODUCT
Second order reflection from crystals used in soft X-ray spectroscopy
Ireneusz Książeksubject
Nuclear and High Energy PhysicsSoft x rayPlasma spectroscopybusiness.industryAstrophysics::High Energy Astrophysical PhenomenaScienceQPbStCondensed Matter Physicssoft X-rayReflection (mathematics)OpticsNuclear Energy and EngineeringKAPSafety Risk Reliability and QualitySpectroscopybusinessWaste Management and DisposalInstrumentationplasma spectroscopydescription
Abstract In this note the ratio of the second to the first order reflection is determined for the KAP and PbSt crystals, for wavelengths corresponding to the Al K-line emission. The source of the radiation was a low-voltage stabilized X-ray tube. The X-rays were detected with a Bragg spectrometer equipped with a proportional counter detector. The signal measured by the proportional counter was subsequently pulse height analyzed.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2015-06-01 | Nukleonika |