6533b82efe1ef96bd129455a
RESEARCH PRODUCT
Fourier transform-ion cyclotron resonance mass spectrometry — A new tool for measuring highly charged ions in an electron beam ion trap
St. BeckerSt. BeckerKlaus WidmannB. R. BeckLutz SchweikhardPeter BeiersdorferS. R. Elliottsubject
Nuclear and High Energy PhysicsPhysics::Plasma PhysicsChemistryHighly charged ionIon trapAtomic physicsIon gunMass spectrometryInstrumentationFourier transform ion cyclotron resonanceIon sourceIon cyclotron resonanceElectron beam ion trapdescription
Abstract Fourier transform-ion cyclotron mass spectrometry has been applied to the study of highly charged ions produced and confined in an electron beam ion trap. Measurements of the relative ion abundance of hydrogenlike and bare krypton ions were made and compared to the abundance ratios determined with standard X-ray techniques. Good agreement was found establishing the reliability of the method as a new tool in highly charged ion research.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 1995-05-01 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms |