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RESEARCH PRODUCT

Structure determination of thin CoFe films by anomalous x-ray diffraction

Gerhard H. FecherClaudia FelserAndrei GloskovskiiKesami SaitoYuya SakurabaJaromír PištoraS. BosuGregory StryganyukSiham OuardiKoki TakanashiJaroslav Hamrle

subject

DiffractionCrystallographyMaterials scienceAnnealing (metallurgy)ScatteringX-ray crystallographyAnalytical chemistryGeneral Physics and AstronomySynchrotron radiationCrystal structureSputter depositionThin film

description

This work reports on the investigation of structure-property relationships in thin CoFe films grown on MgO. Because of the very similar scattering factors of Fe and Co, it is not possible to distinguish the random A2 (W-type) structure from the ordered B2 (CsCl-type) structure with commonly used x-ray sources. Synchrotron radiation based anomalous x-ray diffraction overcomes this problem. It is shown that as grown thin films and 300 K post annealed films exhibit the A2 structure with a random distribution of Co and Fe. In contrast, films annealed at 400 K adopt the ordered B2 structure.

yearjournalcountryeditionlanguage
2012-10-01Journal of Applied Physics
https://doi.org/10.1063/1.4755801