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RESEARCH PRODUCT

Analogy between the effects of a mechanical and chemical perturbation on the conductivity of passive films

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Abstract In order to study the passivity breakdown of a type 316L stainless steel, the electrochemical impedance and surface stresses were measured under straining conditions. The Mott–Schottky analysis, performed at high frequency, appears as very useful method to study, below the apparent yield strength, the effects of a mechanical stress on the capacitance values. The results obtained in sodium chloride media indicate that the semiconducting properties of passive films formed in a tensile stress field reflect a higher vacancies concentration than those formed in a stress-free state, suggesting that the passive film conductivity is increased. It was also shown that the Mott–Schottky plots drop in the presence of tensile surface stresses, indicating that the passive film composition may be different from that formed in the presence of compressive surface stresses. A comparison between the effects of mechanical stresses and those of chloride is proposed.