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RESEARCH PRODUCT
Photoabsorption and MXCD in Photoemission Microscopy for Characterization of Advanced Materials
Yeukuang HwuGerhard H. Fechersubject
PhotonMaterials scienceSiliconMagnetic domainbusiness.industryMagnetic circular dichroismGeneral EngineeringGeneral Physics and Astronomychemistry.chemical_elementPhoton energyCharacterization (materials science)OpticschemistryOptoelectronicsThin filmbusinessAbsorption (electromagnetic radiation)description
We used imaging spectromicroscopy to characterise micro-patterned thin films of magnetic materials like FeNi alloys on Silicon. To investigate devices built from complex materials we applied element-sensitive photoelectron emission microscopy (PEEM). Information about the chemical composition of the imaged sample can be obtained by PEEM via tuning the photon energy to X-ray absorption edges. One aim of our work was to observe oxygen related defects and changes in the composition effecting the physical properties of the materials. The use of circularly polarised photons allows us to image magnetic domains by making use of the magnetic circular dichroism (MXCD).
| year | journal | country | edition | language |
|---|---|---|---|---|
| 1999-01-01 | Japanese Journal of Applied Physics |