6533b833fe1ef96bd129c20a
RESEARCH PRODUCT
Subpixel determination of imperfect circles characteristics
Stéphane BinczakYvon VoisinTadeusz SliwaFabrice Mairessesubject
Computer sciencechemistry.chemical_elementRadonImage processingGeometryGeometric noise010103 numerical & computational mathematics02 engineering and technology01 natural sciencesGrayscaleEdge detectionArtificial IntelligenceDistortion[ INFO.INFO-TI ] Computer Science [cs]/Image Processing0202 electrical engineering electronic engineering information engineering0101 mathematicsComputingMilieux_MISCELLANEOUSRadon transformActive contour modelRadon transformActive contoursDiscrete circlesSubpixel renderingchemistry[INFO.INFO-TI]Computer Science [cs]/Image Processing [eess.IV]Signal Processing020201 artificial intelligence & image processingComputer Vision and Pattern RecognitionModel fittingAlgorithmSoftwaredescription
This article deals with the problem of the determination of characteristics of imperfect circular objects in discrete images, namely the radius and center coordinates. To limit distortion, a multi-level method based on active contours was developed. Its originality is to furnish a set of geometric envelopes in one pass, with a correspondence between grayscale and a regularity scale. The adequacy of this approach was tested with several methods, among them is the Radon-based method. More particularly, this study indicates the relevance of the use of active contours combined with a Radon transform-based method which was improved using a fitting considering the discrete implementation of the Radon transform.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2008-01-01 |