6533b835fe1ef96bd129fece
RESEARCH PRODUCT
Real-space multiple scattering method for angle-resolved photoemission and valence-band photoelectron diffraction and its application to Cu(111)
Jürg OsterwalderPeter KrügerF Da Pievesubject
Diffraction3104 Condensed Matter PhysicsMaterials scienceValence (chemistry)530 PhysicsScatteringPhysics2504 Electronic Optical and Magnetic MaterialsAngle-resolved photoemission spectroscopy10192 Physics InstituteCondensed Matter Physicsmedicine.disease_causeMolecular physicsSpectral lineElectronic Optical and Magnetic MaterialsDelocalized electronmedicineValence bandUltravioletdescription
Abstract: A computational method is presented for angle-resolved photoemission spectra (ARPES) and photoelectron diffraction (PED) in the ultraviolet regime. The one-step model is employed and both initial valence and final continuum states are calculated using the finite-cluster, real-space multiple scattering method. Thereby the approach is versatile and provides a natural link to core-level PED. The method is applied to the Cu(111) valence band and good agreement with experiment is found for both ARPES spectra and PED patterns. When the PED patterns are integrated over a filled band of a single-orbital symmetry, such as Cu-3d, we show, both numerically and analytically, that the exact theory with delocalized initial states can be replaced by the much simpler, core-level-type theory where the initial states are taken as localized.
year | journal | country | edition | language |
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2011-03-21 | Physical Review B |