6533b836fe1ef96bd12a0458

RESEARCH PRODUCT

Electrical, chemical and morphological characterization of tantalum nitride thin film resistors deposited at low temperature by reactive sputtering for plastic electronic applications

A. ScandurraG. F. IndelliBruno Giuseppe PignataroSalvatore Di MarcoM. A. Di StefanoS. RavesiS. Pignataro

subject

10.1002/sia.2681http://hdl.handle.net/10447/25086