6533b836fe1ef96bd12a0458
RESEARCH PRODUCT
Electrical, chemical and morphological characterization of tantalum nitride thin film resistors deposited at low temperature by reactive sputtering for plastic electronic applications
A. ScandurraG. F. IndelliBruno Giuseppe PignataroSalvatore Di MarcoM. A. Di StefanoS. RavesiS. Pignatarosubject
year | journal | country | edition | language |
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2007-01-01 |