6533b836fe1ef96bd12a08fe
RESEARCH PRODUCT
Influence of the U3O7 domain structure on cracking during the oxidation of UO2
Virgil OptasanuJean-sébastien MichaNicolas CretonTony MontesinLaura RaceanuLionel DesgrangesHervé PalancherM. Gamalerisubject
characterisationNuclear and High Energy PhysicsMaterials scienceoxidation[ SPI.MAT ] Engineering Sciences [physics]/MaterialsFOS: Physical sciences02 engineering and technologySubstrate (electronics)UO201 natural sciencesChemical reaction[SPI.MAT]Engineering Sciences [physics]/Materials[PHYS.MECA.MEMA]Physics [physics]/Mechanics [physics]/Mechanics of materials [physics.class-ph]Stress (mechanics)[SPI.MECA.MEMA]Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanics of materials [physics.class-ph]0103 physical sciencesGeneral Materials ScienceThin film010302 applied physicsCondensed Matter - Materials SciencemodeldiffusionMaterials Science (cond-mat.mtrl-sci)[CHIM.MATE]Chemical Sciences/Material chemistry021001 nanoscience & nanotechnologyCrackingCrystallographyNuclear Energy and EngineeringChemical engineering[ CHIM.MATE ] Chemical Sciences/Material chemistry[ SPI.MECA.MEMA ] Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanics of materials [physics.class-ph][ PHYS.MECA.MEMA ] Physics [physics]/Mechanics [physics]/Mechanics of materials [physics.class-ph]U3O7X-ray crystallography0210 nano-technologyLayer (electronics)Single crystaldescription
Abstract Cracking is observed when a UO 2 single crystal is oxidised in air. Previous studies led to the hypothesis that cracking occurs once a critical depth of U 3 O 7 oxidised layer is reached. We present some μ-Laue X-ray diffraction results, which evidence that the U 3 O 7 layer, grown by topotaxy on UO 2 , is made of domains with different crystalline orientations. This observation was used to perform a modelling of oxidation coupling chemical and mechanical parameters, which showed that the domain patterning induces stress localisation. This result is discussed in comparison with stress localisation observed in thin layer deposited on a substrate and used to propose an interpretation of UO 2 oxidation and cracking.
year | journal | country | edition | language |
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2010-07-31 | Journal of Nuclear Materials |