6533b836fe1ef96bd12a11e5

RESEARCH PRODUCT

Extracting parameters from semi-log plots of polycrystalline silicon PV modules outdoor I–V data: Double-exponential model revisited

Ole-morten MidtgardTor Oskar SaetreGeorgi Hristov Yordanov

subject

Polycrystalline siliconSeries (mathematics)Equivalent series resistanceSaturation currentQ factorMathematical analysisengineeringAnalytical chemistryDouble exponential functionengineering.materialDiffusion (business)DiodeMathematics

description

This paper presents a method for extracting physically meaningful parameters from measured I–V curves of PV modules. The 7-parameter double-exponential model is applied in the modeling. The method is based on linear fitting of semi-logarithmic plots. The paper demonstrates a new technique to estimate the series resistance of a module with high accuracy from such plots. As a result, also the reverse saturation current and the quality factor of the diffusion diode can be determined. The method is applied to outdoor I–V data from a test station with three similar, but not identical, polycrystalline-Si modules. The values of the series resistances found with this method deviate somewhat from the values found by indoor measurements by an independent laboratory. The quality factors of the diffusion diodes were in this case found to be somewhat larger than 1, indicating a good, but not perfect quality of the material.

yearjournalcountryeditionlanguage
2010-06-012010 35th IEEE Photovoltaic Specialists Conference
https://doi.org/10.1109/pvsc.2010.5616808