6533b837fe1ef96bd12a1d3d
RESEARCH PRODUCT
A Generalized Semiempirical Approach to the Modeling of the Optical Band Gap of Ternary Al-(Ga, Nb, Ta, W) Oxides Containing Different Alumina Polymorphs
Francesco Di QuartoAndrea ZafforaFrancesco Di FrancoMonica Santamariasubject
010405 organic chemistryGeneralizationChemistryBand gapCationic polymerizationThermodynamicsFunction (mathematics)Aluminum oxideComposition (combinatorics)010402 general chemistry01 natural sciencesArticleMixed oxides0104 chemical sciencesInorganic ChemistryCondensed Matter::Materials ScienceSettore ING-IND/23 - Chimica Fisica ApplicataBand GapPhysics::Atomic and Molecular ClustersPhysics::Chemical PhysicsPhysical and Theoretical ChemistryTernary operationdescription
A generalization of the modeling equation of optical band gap values for ternary oxides, as a function of cationic ratio composition, is carried out based on the semiempirical correlation between the differences in the electronegativity of oxygen and the average cationic electronegativity proposed some years ago. In this work, a novel approach is suggested to account for the differences in the band gap values of the different polymorphs of binary oxides as well as for ternary oxides existing in different crystalline structures. A preliminary test on the validity of the proposed modeling equations has been carried out by using the numerous experimental data pertaining to alumina and gallia polymorphs as well as the crystalline ternary Ga(1–x)AlxO3 polymorphs (α-Ga(1–x)AlxO3 and β-Ga(1–x)AlxO3) covering a large range of optical band gap values (4.50–8.50 eV). To make a more rigorous test of the modeling equation, we extended our investigation to amorphous ternary oxides anodically formed on Al-d-metal alloys (Al-Nb, Al-Ta, and Al-W) covering a large range of d-metal composition (xd-metal ≥ 0.2). In the last case, the novel approach allows one to overcome some difficulties experienced in fitting the optical band gap dependence from the Al-d-metal mixed anodic oxide composition as well as to provide a rationale for the departure, at the lowest d-metal content (xd-metal < 0.2), from the behavior observed for anodic films containing higher d-metal content.
year | journal | country | edition | language |
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2021-01-20 |