6533b837fe1ef96bd12a1d6d

RESEARCH PRODUCT

Near-field scanning optical microscopy to study nanometric structural details of LiNbO3 Zn-diffused channel waveguides

Eugenio CantelarJuan P. Martínez-pastorFernando CussóGinés LifanteJ. LamelaF. JaqueJosep Canet-ferrer

subject

Materials scienceLithium niobateRefractive indexGeneral Physics and AstronomyWaveguide (optics)law.inventionAnnealingchemistry.chemical_compoundAnnealing ; Crystallites ; Lithium compounds ; Nanostructured materials ; Near-field scanning optical microscopy ; Optical waveguides ; Refractive index ; StoichiometryOpticsOptical microscopelaw:FÍSICA [UNESCO]Refractive index contrastSurface layerNear-field scanning optical microscopyÓpticabusiness.industryUNESCO::FÍSICACrystallitesFísicaLithium compoundsNanostructured materialsStoichiometryOptical waveguideschemistryNear-field scanning optical microscopeCrystallitebusinessRefractive index

description

A near-field scanning optical microscope (NSOM) is used to perform structural and optical characterization of the surface layer after Zn diffusion in a channel waveguide fabricated on lithium niobate. A theoretical approach has been developed in order to extract refractive index contrast from NSOM optical transmission measurements (illumination configuration). As a result, different solid phases present on the sample surface can be identified, such as ZnO and ZnNb2O6. They appear like submicrometric crystallites aligned along the domain wall direction, whose origin can be ascribed to some strain relaxation mechanism during the annealing process after Zn diffusion. Jose.Canet-Ferrer@uv.es

yearjournalcountryeditionlanguage
2008-11-01
10.1063/1.3000464http://hdl.handle.net/10486/13819