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RESEARCH PRODUCT
Imaging spin filter for electrons based on specular reflection from iridium (001)
Sergej A. NepijkoChristian TuscheRafael GortD. PerriardC. StiegerA. KrasyukR. FederF. GiebelsGerd SchönhenseKaterina MedjanikE. FedchenkoGerard SalvatellaM. KolbeYves AcremannAndreas FogniniH. GollischJ. KirschnerT. BahlerHans-joachim ElmersPavel LushchykT. MichlmayerAndreas VaterlausD. Kutnyakhovsubject
DiffractionPhysicsSpectrometerScatteringbusiness.industryPolarimeter02 engineering and technologyElectronPhysik (inkl. Astronomie)021001 nanoscience & nanotechnology01 natural sciencesAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic MaterialsOpticsElectron diffraction0103 physical sciencesSpecular reflection010306 general physics0210 nano-technologySpin (physics)businessInstrumentationdescription
Abstract As Stern–Gerlach type spin filters do not work with electrons, spin analysis of electron beams is accomplished by spin-dependent scattering processes based on spin–orbit or exchange interaction. Existing polarimeters are single-channel devices characterized by an inherently low figure of merit (FoM) of typically 10 −4 –10 −3 . This single-channel approach is not compatible with parallel imaging microscopes and also not with modern electron spectrometers that acquire a certain energy and angular interval simultaneously. We present a novel type of polarimeter that can transport a full image by making use of k -parallel conservation in low-energy electron diffraction. We studied specular reflection from Ir (001) because this spin-filter crystal provides a high analyzing power combined with a “lifetime” in UHV of a full day. One good working point is centered at 39 eV scattering energy with a broad maximum of 5 eV usable width. A second one at about 10 eV shows a narrower profile but much higher FoM. A relativistic layer-KKR SPLEED calculation shows good agreement with measurements.
year | journal | country | edition | language |
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2013-01-01 | ULTRAMICROSCOPY |