6533b838fe1ef96bd12a3a58
RESEARCH PRODUCT
Surface resonance of thin films of the Heusler half-metal Co2MnSi probed by soft x-ray angular resolved photoemission spectroscopy
Jan MinárMartin JourdanJonas A. KriegerJonas A. KriegerJürgen BraunChristian LidigVladimir N. StrocovMathias KläuiHubert EbertAndrei Gloskovskiisubject
Materials scienceCondensed matter physicsSpin polarizationSpintronicsPhotoemission spectroscopyCenter (category theory)Resonance02 engineering and technology021001 nanoscience & nanotechnology01 natural sciencesBrillouin zoneCondensed Matter::Materials ScienceCondensed Matter::Superconductivity0103 physical sciencesCondensed Matter::Strongly Correlated ElectronsHalf-metal010306 general physics0210 nano-technologySpectroscopydescription
Heusler compounds are promising materials for spintronics with adjustable electronic properties including 100% spin polarization at the Fermi energy. We investigate the electronic states of ${\mathrm{AlO}}_{x}$ capped epitaxial thin films of the ferromagnetic half-metal ${\mathrm{Co}}_{2}\mathrm{MnSi}$ ex situ by soft x-ray angular resolved photoemission spectroscopy (SX-ARPES). Good agreement between the experimental SX-ARPES results and photoemission calculations including surface effects was obtained. In particular, we observed in line with our calculations a large photoemission intensity at the center of the Brillouin zone, which does not originate from bulk states, but from a surface resonance. This provides strong evidence for the validity of the previously proposed model based on this resonance, which was applied to explain the huge spin polarization of ${\mathrm{Co}}_{2}\mathrm{MnSi}$ observed by angular-integrating UV-photoemission spectroscopy.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2019-05-28 | Physical Review B |