6533b839fe1ef96bd12a6366

RESEARCH PRODUCT

Evolution of dielectric permittivity under applied field in PLZT 8.3/70/30 ceramics

Eriks BirksM. KundzinshAndris Sternberg

subject

PermittivityMaterials scienceCondensed matter physicsField (physics)business.industryRelative permittivityDielectricFunction (mathematics)Condensed Matter PhysicsElectronic Optical and Magnetic MaterialsVacuum permittivityOpticsvisual_artJumpvisual_art.visual_art_mediumCeramicbusiness

description

Abstract The jump of dielectric permittivity as function of bias field applied after various duration of storage at the measurement temperature is investigated. The influence of storage time on ϵ(E=) depends on the value of bias field and frequency of measuring field. It is found that ϵ(E=) depends on the path of how particular field value is reached.

https://doi.org/10.1080/00150190008227971