6533b839fe1ef96bd12a6366
RESEARCH PRODUCT
Evolution of dielectric permittivity under applied field in PLZT 8.3/70/30 ceramics
Eriks BirksM. KundzinshAndris Sternbergsubject
PermittivityMaterials scienceCondensed matter physicsField (physics)business.industryRelative permittivityDielectricFunction (mathematics)Condensed Matter PhysicsElectronic Optical and Magnetic MaterialsVacuum permittivityOpticsvisual_artJumpvisual_art.visual_art_mediumCeramicbusinessdescription
Abstract The jump of dielectric permittivity as function of bias field applied after various duration of storage at the measurement temperature is investigated. The influence of storage time on ϵ(E=) depends on the value of bias field and frequency of measuring field. It is found that ϵ(E=) depends on the path of how particular field value is reached.
year | journal | country | edition | language |
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2000-01-01 | Ferroelectrics |