6533b850fe1ef96bd12a851e
RESEARCH PRODUCT
High-pressure x-ray absorption study of GaTe including polarization
A. San MiguelV. MuñozAlfredo SeguraJulio Pellicer-porressubject
Bond lengthMaterials scienceAbsorption spectroscopyExtended X-ray absorption fine structureLinear polarizationCompressibilitySynchrotron radiationAtomic physicsAnisotropyMolecular physicsX-ray absorption fine structuredescription
The evolution of the local structure in GaTe under pressure is studied by x-ray absorption spectroscopy experiments at the Ga K-edge (10.368 keV) on oriented single crystals. Taking advantage of the linearly polarized character of synchrotron radiation, the pressure evolution of both the Ga-Te and the in-plane Ga-Ga bond lengths could be determined, in spite of the small amplitude of the latter. Our measurements show that both distances are much less compressible than what could be inferred from the bulk compressibility, which evidences a strong variation of Ga-Ga-Te and Te-Ga-Te angles under pressure. The Te-Te intralayer distance perpendicular to the layers is observed to increase with increasing pressure. In the high-pressure NaCl phase, no anisotropy of the x-ray absorption fine structure spectrum is detected and local and bulk compressibilities coincide. With the help of microphotographic measurements the main source of instability of the layer structure is attributed to the tilt of the Ga-Ga bond with respect to the layer plane.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2000-01-01 |