6533b851fe1ef96bd12a9765
RESEARCH PRODUCT
Refractive index of the CuAlO2delafossite
Julio Pellicer-porresAlfredo SeguraDongyoo Kimsubject
InfraredChemistrybusiness.industryAnalytical chemistryLow frequencyengineering.materialCondensed Matter PhysicsElectronic Optical and Magnetic MaterialsDelafossiteOpticsDispersion (optics)Materials ChemistryPerpendicularengineeringElectrical and Electronic EngineeringRefractive index dispersionConstant (mathematics)businessRefractive indexdescription
The refractive index of the CuAlO2 delafossite has been determined from interference measurements in single crystals performed in the visible, near and mid infrared regions of the spectrum. The analysis of the refractive index dispersion corresponding to light polarization perpendicular to the c-axis (P ⊥ c) yields a static dielectric constant of 0 = 7.7 ± 0.8 and a low frequency electronic constant ∞ = 5.1 ± 0.1. The relevant infrared active mode is found to be at 550 ± 25 cm−1. The electronic contribution can be well described by a Penn gap at 39 000 ± 1000 cm−1. Both the refractive index and its dispersion are found to be smaller for P||c than for P ⊥ c.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2008-11-26 | Semiconductor Science and Technology |