6533b853fe1ef96bd12abeb7
RESEARCH PRODUCT
Phase mixture in MOCVD and reactive sputtering TiOxNy thin films revealed and quantified by XPS spectra factorial analysis
Jérôme GuillotJean-marie ChappeOlivier HeintzNicolas MartinLuc ImhoffJamal Takadoumsubject
[ SPI.MAT ] Engineering Sciences [physics]/Materials[SPI.MAT] Engineering Sciences [physics]/MaterialsComputingMilieux_MISCELLANEOUS[SPI.MAT]Engineering Sciences [physics]/Materialsdescription
International audience
year | journal | country | edition | language |
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2006-01-01 |