6533b854fe1ef96bd12af20c
RESEARCH PRODUCT
Surface pattern recording in Sb2Se3 thin films
Vjaceslavs GerbredersA. GerbredersOksana ShimanVadims Kolbjonokssubject
Materials scienceAtomic force microscopybusiness.industryCondensed Matter PhysicsElectronic Optical and Magnetic MaterialsSurface patternElectron beam irradiationStress (mechanics)OpticsVolume (thermodynamics)ThermalMaterials ChemistryCeramics and CompositesIrradiationThin filmComposite materialbusinessdescription
Abstract Results on the modification of Sb 2 Se 3 thin film surface topology by irradiation followed by wet-etching are given. Comparison of study results revealed the possible role of purely electronic and thermal processes in the relief formation. The latter is supposed to be connected with radiation-induced defect creation, free volume increase under the increased fluidity conditions as well as with the possible additional influence of electrostatic forces and stress. Changes in surface characteristics are presented and potential applications of this treatment are discussed.
year | journal | country | edition | language |
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2013-10-01 | Journal of Non-Crystalline Solids |