6533b855fe1ef96bd12b1ac6
RESEARCH PRODUCT
Investigation of the superstructure of native collagen by a combination of small angle X-ray scattering, electron microscopy and light diffraction
G. BenekeW. WilkeHanns-georg KilianK. PauliniH. Meyersubject
Light diffractionMaterials sciencePolymers and PlasticsSmall-angle X-ray scatteringScatteringAnalytical chemistrylaw.inventionColloid and Surface ChemistrylawMaterials ChemistryPhysical and Theoretical ChemistryElectron microscopeBiological small-angle scatteringSmall-angle scatteringSuperstructure (condensed matter)Electron microscopicdescription
It is shown that there exists a direct correlation between the light diffraction pattern of an electron-microscopical picture and the X-ray small angle scattering. By this means it can be proved for native collagen prepared by a special method that the density pattern of stained samples imaged in the electron microscopy is identical with the density pattern available from moist fibres. The reflex intensities of the small angle X-ray scattering are taken for calculating the density structure whereby the necessary phases are delivered by the electron microscopic examination combined with light diffraction.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 1978-04-01 | Colloid and Polymer Science |