6533b857fe1ef96bd12b4ce8

RESEARCH PRODUCT

All-optical super resolved and extended depth of focus imaging with random pinhole array aperture

Javier GarciaZeev Zalevsky

subject

PhysicsExtended depth of focusArray aperturebusiness.industryComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISIONImage processingSuperresolutionAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic MaterialsAll opticalOpticsAperture planePinhole (optics)Electrical and Electronic EngineeringPhysical and Theoretical ChemistrybusinessImage resolution

description

In this paper, we present a novel approach which allows combining super resolved imaging with extended depth of focus while the result is obtained by all-optical means and no digital processing is required. The presented approach for the super resolved imaging includes attaching a random pinhole array plate to the aperture plane of the imaging system. The energetic efficiency of the system is high and it is much larger than an imaging through a single pinhole which also has extended depth of focus. The super resolving result is obtained by mechanic scanning of the aperture plane with the random plate.

yearjournalcountryeditionlanguage
2008-03-01Optics Communications
https://doi.org/10.1016/j.optcom.2007.10.065