6533b858fe1ef96bd12b6249

RESEARCH PRODUCT

Preparation and Characterization of Tin Tungstate Thin Films

Alexei KuzminMartins ZubkinsR. Kalendarev

subject

DiffractionMaterials sciencebusiness.industrySputter depositionCondensed Matter PhysicsNanocrystalline materialElectronic Optical and Magnetic MaterialsCharacterization (materials science)symbols.namesakePhase (matter)Optical recordingsymbolsOptoelectronicsThin filmRaman spectroscopybusiness

description

Tin tungstate thin films were prepared by dc magnetron sputtering method and studied by x-ray diffraction, confocal microscopy and Raman spectroscopy. It is shown that the films are composed mainly of nanocrystalline α-SnWO4 phase. The possibility to use these films as write-once optical recording media is demonstrated.

yearjournalcountryeditionlanguage
2015-08-05Ferroelectrics
https://doi.org/10.1080/00150193.2015.1059682