6533b859fe1ef96bd12b78fd

RESEARCH PRODUCT

High Quality Factor Silicon Membrane Metasurface for Intensity-Based Refractive Index Sensing

Costantino De AngelisDavide RoccoAndrea LocatelliLuca CarlettiMarco GandolfiAndrea Tognazzi

subject

Materials sciencebusiness.industryMeasure (physics)MetasurfaceSettore ING-INF/02 - Campi ElettromagneticiQC350-467Optics. LightTA1501-1820Silicon membranesensing metasurface BICQuality (physics)Metasurface sensingBICOptoelectronicsApplied optics. PhotonicsbusinessRefractive indexPlasmonIntensity (heat transfer)sensing

description

We propose a new sensing device based on all-optical nano-objects placed in a suspended periodic array. We demonstrate that the intensity-based sensing mechanism can measure environment refractive index change of the order of 1.8×10−6, which is close to record efficiencies in plasmonic devices.

10.3390/opt2030018http://hdl.handle.net/11379/547602