6533b85afe1ef96bd12b89a6
RESEARCH PRODUCT
Precision mass measurements using a penning trap and highly charged ions produced in an electron beam ion source
R. SchuchP. SenneEdward BeebeF. SöderbergG. RouleauR. JertzH. BorgenstrandG. BollenC. CarlbergAlexander PikinRido MannA. PaálH. HartmannT. SchwarzL. LiljebyI. BergströmH.-j. Klugesubject
Materials scienceCyclotronCondensed Matter PhysicsIon gunPenning trapAtomic and Molecular Physics and OpticsIon sourceIonlaw.inventionPhysics::Plasma PhysicslawCathode rayIon trapAtomic physicsMathematical PhysicsExcitationdescription
A method for precision mass measurements in a Penning trap using highly charged ions produced in an electron beam ion source (CRYSIS) has been developed. The cyclotron frequencies for O8+, 7+, 6+, 5+ and Ar18+, 17+, 16+, 15+, 14+, 13+ ions have been determined by the excitation of the sum frequency v+ + v−. In addition to CRYSIS ions, H+, H2+ and He+ ions were produced by electron bombardment of the H2 rest gas or helium gas introduced through an UHV leak valve into an auxiliary ion trap (or a pre-trap). A technique for fast (seconds) interchanging of the ion species in the precision trap has been implemented to reduce the long term magnetic field drift.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 1997-01-01 | Physica Scripta |