6533b85efe1ef96bd12c057c
RESEARCH PRODUCT
Description of x-ray beams using the fluorescence yields of a set of thick targets
C. MartínezV. Delgadosubject
Spectral power distributionChemistrybusiness.industryAstrophysics::High Energy Astrophysical PhenomenaNumerical analysisX ray beamFluorescenceSet (abstract data type)OpticsApproximation errorYield (chemistry)businessSpectroscopyBeam (structure)description
Quantitative methods in x-ray fluorescence analysis require a knowledge of the spectral distribution of the fluorescence-exciting beam. The use of XRF yield measurements of a set of thick pure element targets is proposed for the description of a fluorescence-exciting x-ray beam, without the need to obtain its spectral distribution. This new approach is derived theoretically and verified by comparing thin-target yields calculated from XRF yield measurements of thick pure element specimens with those obtained from a calculated spectral distribution. The difference between the two methods of obtaining the thin-target yields is within 9% relative error.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 1995-09-01 | X-Ray Spectrometry |