6533b861fe1ef96bd12c59fb
RESEARCH PRODUCT
Melting of tantalum at high pressure determined by angle dispersive x-ray diffraction in a double-sided laser-heated diamond-anvil cell
Daniel ErrandoneaDaniel ErrandoneaMaddury SomayazuluDaniel HäusermannHo-kwang Maosubject
DiffractionBulk modulusCondensed Matter - Materials ScienceMaterials scienceTantalumAnalytical chemistryMaterials Science (cond-mat.mtrl-sci)FOS: Physical scienceschemistry.chemical_elementCondensed Matter PhysicsMelting curve analysisThermal expansionDiamond anvil cellchemistryCondensed Matter::SuperconductivityX-ray crystallographyGeneral Materials SciencePhase diagramdescription
The high pressure and high temperature phase diagram of Ta has been studied in a laser-heated diamond-anvil cell (DAC) using x-ray diffraction measurements up to 52 GPa and 3800 K. The melting was observed at nine different pressures, being the melting temperature in good agreement with previous laser-heated DAC experiments, but in contradiction with several theoretical calculations and previous piston-cylinder apparatus experiments. A small slope for the melting curve of Ta is estimated (dTm/dP = 24 K/GPa at 1 bar) and a possible explanation for this behaviour is given. Finally, a P-V-T equation of states is obtained, being the temperature dependence of the thermal expansion coefficient and the bulk modulus estimated.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2003-10-13 |