6533b862fe1ef96bd12c61e7
RESEARCH PRODUCT
Pre-determining the location of electromigrated gaps by nonlinear optical imaging
G. Colas Des FrancsMickaël BuretJean DellingerAlexandre BouhelierMarie-maxime Mennemanteuilsubject
Materials sciencePhysics and Astronomy (miscellaneous)Condensed Matter - Mesoscale and Nanoscale Physics[PHYS.PHYS]Physics [physics]/Physics [physics]business.industryNanowireFOS: Physical sciencesNonlinear opticsPhysics::OpticsRadiationLaserElectromigrationlaw.inventionNonlinear systemElectrical resistivity and conductivitylawMesoscale and Nanoscale Physics (cond-mat.mes-hall)OptoelectronicsbusinessUltrashort pulseOptics (physics.optics)Physics - Opticsdescription
In this paper we describe a nonlinear imaging method employed to spatially map the occurrence of constrictions occurring on an electrically-stressed gold nanowire. The approach consists at measuring the influence of a tightly focused ultrafast pulsed laser on the electronic transport in the nanowire. We found that structural defects distributed along the nanowire are efficient nonlinear optical sources of radiation and that the differential conductance is significantly decreased when the laser is incident on such electrically-induced morphological changes. This imaging technique is applied to pre-determined the location of the electrical failure before it occurs.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2014-06-11 |