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RESEARCH PRODUCT
Growth and characterization of Mg 1‐x Cd x O thin films
Vicente Muñoz-sanjoseV. SalletM. Carmen Martínez-tomásCorinne SartelLluís-manel Guiasubject
DiffractionMaterials scienceScanning electron microscopeAlloyAnalytical chemistry02 engineering and technologyChemical vapor depositionengineering.material010402 general chemistry021001 nanoscience & nanotechnologyCondensed Matter Physics01 natural sciences0104 chemical sciencesMetalvisual_artPhase (matter)visual_art.visual_art_mediumengineeringMetalorganic vapour phase epitaxyThin film0210 nano-technologydescription
In this paper, we study the growth of thin films of the Mg1–xCdxO alloy in the Mg-rich range of compositions by using the metal organic chemical vapour deposition (MOCVD) method at low pressure. X-ray diffraction (XRD) has been used to analyse the compound formation and the progressive incorporation of Cd2+ ions into the cubic MgO lattice. Both, layers with a single-cubic phase of Mg1–xCdxO and layers with a phase separation, where Cd1–xMgxO and Mg1–xCdxO coexist, have been studied. Finally, a morphological study of the layers has been carried out by using scanning electron microscopy (SEM) and the layers' composition has been measured by energy dispersive X-ray analysis (EDX). (© 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2016-03-16 | physica status solidi c |