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RESEARCH PRODUCT
Left-handed metamaterial coatings for subwavelength-resolution imaging
Carlos J. Zapata-rodríguezJuan Jose MiretDavid PastorLuis Enrique Martínez Martínezsubject
Point spread functionPhysicsbusiness.industryPlane (geometry)Resolution (electron density)MetamaterialPhysics::OpticsImage planeAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic MaterialsOpticsTransmission (telecommunications)Negative refractionImage formation theoryMetamaterialsComputer Vision and Pattern RecognitionTransmission coefficientbusinessAberration compensationÓpticadescription
We report on a procedure to improve the resolution of far-field imaging by using a neighboring high-index medium that is coated with a left-handed metamaterial. The resulting plot can also exhibit an enhanced transmission by considering proper conditions to retract backscattering. Based on negative refraction, geometrical aberrations are considered in detail since they may cause a great impact in this sort of diffraction-unlimited imaging by reducing its resolution power. We employ a standard aberration analysis to refine the asymmetric configuration of metamaterial superlenses. We demonstrate that low-order centrosymmetric aberrations can be fully corrected for a given object plane. For subwavelength-resolution imaging, however, high-order aberrations become of relevance, which may be balanced with defocus. Not only the point spread function but also numerical simulations based on the finite-element method support our theoretical analysis, and subwavelength resolution is verified in the image plane. This research was funded by the Spanish Ministry of Economy and Competitiveness under the project TEC2009-11635.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2012-08-30 |