6533b871fe1ef96bd12d1b9b
RESEARCH PRODUCT
The relevance of point defects in studying silica-based materials from bulk to nanosystems
Diego Di FrancescaGianpiero BuscarinoAntonino AlessiSimonpietro AgnelloJochen Kuhnhennsubject
optical fibersMaterials scienceOptical fiberOptical fiberComputer Networks and Communicationslcsh:TK7800-8360Nanotechnology02 engineering and technology01 natural scienceslaw.inventionPoint defectNanoparticlelaw0103 physical sciencespoint defectsMicroelectronicsRelevance (information retrieval)Electrical and Electronic Engineering010308 nuclear & particles physicsbusiness.industryScale (chemistry)lcsh:ElectronicsSilica021001 nanoscience & nanotechnologyCrystallographic defectHardware and ArchitectureControl and Systems EngineeringSignal Processingnanoparticles0210 nano-technologybusinessdescription
The macroscopic properties of silica can be modified by the presence of local microscopic modifications at the scale of the basic molecular units (point defects). Such defects can be generated during the production of glass, devices, or by the environments where the latter have to operate, impacting on the devices’ performance. For these reasons, the identification of defects, their generation processes, and the knowledge of their electrical and optical features are relevant for microelectronics and optoelectronics. The aim of this manuscript is to report some examples of how defects can be generated, how they can impact device performance, and how a defect species or a physical phenomenon that is a disadvantage in some fields can be used as an advantage in others.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2019-01-01 |