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RESEARCH PRODUCT
Piezospectroscopic study of mechanical stress in Al2O3:Cr under swift heavy ion irradiation
Yu. S. KovalevK. HavanscakG. BujnarowskiG. BujnarowskiV.a. Skuratovsubject
Stress fieldSwift heavy ionMaterials scienceRadiation damageIrradiationAtomic physicsConfocal scanning microscopyCondensed Matter PhysicsPenetration depthInstrumentationSingle crystalSurfaces Coatings and FilmsIondescription
Abstract The spatial distribution of mechanical stresses in Al2O3:Cr single crystal irradiated with (1 ÷ 3) MeV/amu Kr, Xe and Bi ions has been studied by using laser confocal scanning microscopy technique. The stress level as a function of the ion penetration depth has been evaluated from depth-resolved photostimulated R-line luminescence spectra exploiting the piezospectroscopic method. As it was found, the stress field generated by swift heavy ion irradiation is composed of stresses with maximal magnitude comparable with the ultimate stress limit of ruby crystals. Experimental data are discussed in the framework of a model considering the Cr3+ atoms as individual piezosensors.
year | journal | country | edition | language |
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2009-05-01 | Vacuum |