6533b871fe1ef96bd12d253b
RESEARCH PRODUCT
Scanning electron microscopy analysis of defect clusters in multicrystalline solar grade silicon solar cells
Jan Ove OddenCharly BerthodTor Oskar Saetresubject
Materials scienceSiliconScanning electron microscopebusiness.industryfood and beverageschemistry.chemical_elementElectroluminescenceSecondary electronsPolymer solar cellMonocrystalline siliconchemistryCluster (physics)OptoelectronicsGrain boundarybusinessdescription
Solar cells from an identical commercial manufacturing unit have been investigated by electroluminescence to first detect the defect clusters. A further analysis has been done by scanning electron microscopy in secondary electron imaging mode to understand the propagation mechanism of defects. It appears that defect cluster boundaries can be very sharp or spread in the bulk with little apparent effect on the overall cell efficiency. And it is shown that grain boundaries act clearly as arrests to further propagation of these defects.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2014-06-01 | 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) |