6533b872fe1ef96bd12d4460

RESEARCH PRODUCT

Modeling epitaxial film growth of C$_{60}$ revisited

Thomas SpeckWilliam Janke

subject

Materials scienceFullereneFOS: Physical sciences02 engineering and technologySubstrate (electronics)01 natural sciencessymbols.namesakeMolecular dynamicsCondensed Matter::Materials Science0103 physical sciencesMesoscale and Nanoscale Physics (cond-mat.mes-hall)Kinetic Monte Carlo010306 general physicsArrhenius equationCondensed Matter - Materials ScienceCondensed Matter - Mesoscale and Nanoscale PhysicsCondensed matter physicsMaterials Science (cond-mat.mtrl-sci)Detailed balanceComputational Physics (physics.comp-ph)021001 nanoscience & nanotechnologysymbolsSubatomic particle0210 nano-technologyPhysics - Computational PhysicsEnergy (signal processing)

description

Epitaxial films evolve on time and length scales that are inaccessible to atomistic computer simulation methods like molecular dynamics (MD). To numerically predict properties for such systems, a common strategy is to employ kinetic Monte Carlo simulations, for which one needs to know the transition rates of the involved elementary steps. The main challenge is thus to formulate a consistent model for the set of transition rates and to determine its parameters. Here, we revisit a well-studied model system, the epitaxial film growth of the fullerene ${\mathrm{C}}_{60}$ on an ordered ${\mathrm{C}}_{60}$ substrate (111). We implement a systematic multiscale approach in which we determine transition rates through MD simulations of specifically designed initial configurations. These rates follow Arrhenius's law, from which we extract energy barriers and attempt rates. We discuss the issue of detailed balance for the resulting rates. Finally, we study the morphology of subatomic and multilayer film growth and compare simulation results to experiments. Our model enables further studies on multilayer growth processes of ${\mathrm{C}}_{60}$ on other substrates.

https://dx.doi.org/10.48550/arxiv.2003.01660