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RESEARCH PRODUCT
<title>Indentation creep and stress relaxation in amorphous As-S-Se and As-S films</title>
R. PokulisJanis ManiksI. ManikaJanis Teterissubject
Stress (mechanics)Materials scienceCreepIndentationStress relaxationForensic engineeringRelaxation (physics)Diffusion creepComposite materialDeformation (engineering)Amorphous soliddescription
The indentation creep in as-deposited and photopolymerized As- S-Se and As-S films has been investigated. The results show pronounced relaxation of mechanical stresses in the films at room temperature. The relationship (sigma) equals B (epsilon) m between the deformation rate and the stress is observed and the values of the deformation rate sensitivity exponent m < 1 are found. The creep rate was found to be dependent on deposition conditions of layers, applied indentation load, structural state of the material and light irradiation during the creep test.© (2001) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2001-04-10 | Optical Organic and Inorganic Materials |