6533b874fe1ef96bd12d6060

RESEARCH PRODUCT

An Analysis of the Broadening Induced by Beam Damage in Transmission Electron Diffraction Spots from an Oriented Aliphatic Monolayer

I. R. PetersonR. Steitz

subject

Diffractionchemistry.chemical_compoundCrystallographyElectron diffractionChemistryMonolayerGrain boundaryCrystal structureDislocationSilicon monoxideMolecular physicsBeam (structure)

description

We have analysed the progressive changes in diffraction spot shape during prolonged transmission electron diffraction observation of a soap monolayer supported on a thin polymer film. The material used to form the monolayer was cadmium eicosanoate (arachidate). The observed changes cannot be explained at all in terms of the chemical crosslinking which is known to occur as a result of beam damage, nor completely in terms of the strain fields caused by unbound dislocation defects of the crystalline lattice. The most plausible explanation involves the formation of linear dislocation aggregates which resemble grain boundaries but yet which are not linked into a continuous network. The evolution of the spot profiles can be explained in terms of three processes: firstly the mobilisation of existing dislocations; secondly, the creation of new dislocations; and finally the growth of dislocation aggregates. A mechanism for the creation of dislocations is proposed.

yearjournalcountryeditionlanguage
1991-01-01
https://doi.org/10.1007/978-94-011-3278-7_33