Search results for " Transmission Electron Microscopy"
showing 10 items of 143 documents
Transmission electron microscopy investigation of oxidation of (110)NiAl single crystal with wedge-shaped profile
2016
Abstract Low energy electron diffraction (LEED), high resolution transmission electron microscopy (HRTEM), energy-dispersive X-ray (EDX), and electron energy loss spectroscopy (EELS) investigations of oxidation processes in (110)NiAl single crystal of wedge like shape, i.e., on the sample’s areas of different thickness, were carried out. It was found that in the result of several cycles of ion etching, annealing and oxidation the upper layer of (110)NiAl is enriched with Ni. With the increase of Ni concentration from 50 to 100 at. %, the stoichiometry of the near surface area changes and the new phases of Ni3Al and Ni with Al doping are formed one after another. Up to Ni content of 75 at. %…
Asymmetric tungsten oxide nanobrushes via oriented attachment and Ostwald ripening
2011
Tungsten oxide nanobrushes were synthesized using a solvothermal approach that lead to self-branching in the presence of citric acid and hexadecylamine as surfactants. Our synthetic approach yielded branched nanorods of tungsten oxide in a single synthetic step. Based on our results, we propose a phenomenological pathway for the formation, branching, and assembly of these tungsten oxide brushes. The formation of tungsten oxide brushes proceeds by thermal decomposition of ammonium tungstate in the presence of citric acid and hexadecylamine. The pale blue powder obtained after solvothermal reaction was analyzed by X-ray diffraction (XRD), transmission electron microscopy (TEM) and high-resolu…
Microwave-assisted synthesis of anhydrous CdS nanoparticles in a water-oil microemulsion.
2006
Abstract Microwave irradiation at a frequency of 2.45 GHz and a power ranging between 22 and 30 W was used, in a water–oil microemulsion at 35 ± 2 ° C , to obtain stable, small, crystalline, anhydrous CdS nanoparticles exhibiting enhanced luminescence properties. The process of nanoparticles growth at different irradiation times was followed by UV–vis spectroscopy. It was observed that irradiated nanoparticles grew faster and their size reached a constant value. The final mean nanoparticle diameter was 2.7 nm, smaller than that observed in a non-irradiated sample, in which particle dimensions slowly increased even after 10 h. This finding was confirmed by high resolution transmission electr…
Silicon Nanocrystals Produced by Nanosecond Laser Ablation in an Organic Liquid
2011
Small (3−5 nm in diameter following HRTEM images) Si nanocrystals were produced in a two-stage process including (1) nanosecond laser ablation of a Si target in an organic liquid (chloroform) that results in formation of big composite polycrystalline particles (about 20−100 nm average diameter) and (2) ultrasonic post-treatment of Si nanoparticles in the presence of HF. The post-treatment is responsible for disintegration of the composite Si particles, release of small individual nanocrystals, and reduction of their size due to HF-induced etching of Si oxide. The downshift and broadening of the ∼520 cm−1 Raman phonon band of the small Si nanocrystals with respect to the bulk Si Raman band i…
Structural characterization of bulk and nanoparticle lead halide perovskite thin films by (S)TEM techniques.
2019
Lead halide (APbX3) perovskites, in polycrystalline thin films but also perovskite nanoparticles (NPs) has demonstrated excellent performance to implement a new generation of photovoltaic and photonic devices. The structural characterization of APbX3 thin films using (scanning) transmission electron microscopy ((S)TEM) techniques can provide valuable information that can be used to understand and model their optoelectronic performance and device properties. However, since APbX3 perovskites are soft materials, their characterization using (S)TEM is challenging. Here, we study and compare the structural properties of two different metal halide APbX3 perovskite thin films: bulk CH3NH3PbI3 prep…
Structural and chemical characterization of CdSe-ZnS core-shell quantum dots
2018
Abstract The structural and compositional properties of CdSe-ZnS core-shell quantum dots (QDs) with a sub-nm shell thickness are analyzed at the atomic scale using electron microscopy. QDs with both wurtzite and zinc blende crystal structures, as well as intermixing of the two structures and stacking faults, are observed. High-angle annular dark-field scanning transmission electron microscopy suggests the presence of a lower atomic number epitaxial shell of irregular thickness around a CdSe core. The presence of a shell is confirmed using energy dispersive X-ray spectroscopy. Despite the thickness irregularities, the optical properties of the particles, such as photoluminescence and quantum…
The evolution of the fraction of Er ions sensitized by Si nanostructures in silicon-rich silicon oxide thin films
2009
Photoluminescence (PL) and time-resolved PL experiments as a function of the elaboration process are performed on Er-doped silicon-rich silicon oxide (SRO:Er) thin films grown under NH(3) atmosphere. These PL measurements of the Er(3+) emission at 1.54 microm under non-resonant pumping with the Er f-f transitions are obtained for different Er(3+) concentrations, ranging from 0.05 to 1.4 at.%, and various post-growth annealing temperatures of the layers. High resolution transmission electron microscopy (HRTEM) and energy-filtered TEM (EFTEM) analysis show a high density of Si nanostructures composed of amorphous and crystalline nanoclusters varying from 2.7 x 10(18) to 10(18) cm(-3) as a fun…
Electron Crystallography – New Methods to Explore Structure and Properties of the Nano World
2012
Electron crystallography, as the branch of science that uses electron scattering, developed in the last century into a manifold and powerful approach to study the structure of matter. Major historical milestones of this development are discussed. Especially electron diffraction experienced recently a renaissance and grew into an established method of structure analysis. The techniques of data collection and processing available nowadays are described.
Peculiarities of imaging one- and two-dimensional structures using an electron microscope in the mirror operation mode.
2001
Measurements performed in an electron microscope with the mirror operation mode are most sensitive to local electric fields and geometrical roughness of any kind of the object being studied. The object with a geometrical relief is equivalent to a smooth surface with an effective distribution of microfields. Electrons forming the image interact with the local microfields for an extended time: during approach to the object, deceleration and acceleration away from the object. As a result, the electron trajectories can be strongly distorted, and the contrast changes essentially, leading to image deformation of details of the object under investigation and to lowering of the resolution. These ef…
Analysis of Optical Systems, Contrast Depth, and Measurement of Electric and Magnetic Field Distribution on the Object's Surface in Mirror Electron M…
2011
Abstract The contrast depth is analyzed as well, that is the sensitivity of electron mirror microscope to disorders of homogeneity on the object (local magnetic and electric fields, surface relief). Because of the latter ones, electron trajectories feel disturbances (electrons acquire additional increment velocity in radial and azimuthal directions), which leads to the shift of the observed point on the screen and, as a consequence, to the image contrast. Since the electron energy, when reflected, tends to zero, electrons are influenced by heterogeneities for a long time. It causes high sensitivity to heterogeneities, up to the crossing of electron trajectories (caustics are generated). The…