Search results for " technology"
showing 10 items of 23337 documents
Simultaneous Synthesis and Consolidation of Nanostructured MoSi2
2002
A new process combining electric field activation and the imposition of pressure from mechanically activated powder mixtures is demonstrated as a means to simultaneously synthesize and densify nano-MoSi2 in one step. Nanophase reactants (Mo + 2Si) produced by mechanical activation are reacted by field activation with the simultaneous application of a uniaxial pressure. Mo + 2Si powders were comilled in a specially designed planetary mill to obtain nanometric reactants but to avoid formation of any product phases. These were then subjected to high alternating currents (1600 A) and pressures of 106 MPa. Under these conditions, a reaction is initiated and completed within a short period of tim…
Correlative study of structural and optical properties of ZnSe under severe plastic deformation
2019
The effect of plastic deformation on the optical and structural properties of ZnSe crystals has been investigated. The optical properties have been monitored by cathodoluminescence measurements as a function of the deformation degree. Remarkable differences in the defect-related emissions from the most severely deformed areas have been encountered. Deformation of the crystal lattice of ZnSe, associated with slip phenomena, has been studied by means of Electron Backscattered Diffraction and micro-Raman spectroscopy. The relation between the deformation and the optical properties of the ZnSe crystals has been described.
Low energy nano diffraction (LEND) – A versatile diffraction technique in SEM
2019
Abstract Electron diffraction is a powerful characterization method that is used across different fields and in different instruments. In particular, the power of transmission electron microscopy (TEM) largely relies on the capability to switch between imaging and diffraction mode enabling identification of crystalline phases and in-depth studies of crystal defects, to name only examples. In contrast, while diffraction techniques have found their way into the realm of scanning electron microscopy (SEM) in the form of electron backscatter diffraction and related techniques, on-axis transmission diffraction is still in its infancy. Here we present a simple but versatile setup that enables a ‘…
Fast-ADT: A fast and automated electron diffraction tomography setup for structure determination and refinement.
2020
Abstract Electron crystallography has focused in the last few years on the analyses of microcrystals, mainly organic compounds, triggered by recent publications on acquisition methods based on direct detection cameras and continuous stage tilting. However, the main capability of a transmission electron microscope is the access to features at the nanometre scale. In this context, a new acquisition method, called fast and automated diffraction tomography (Fast-ADT), has been developed in form of a general application in order to get the most of the diffraction space from a TEM. It consists of two subsequent tilt scans of the goniometric stage; one to obtain a crystal tracking file and a secon…
Radial composition of single InGaN nanowires: a combined study by EDX, Raman spectroscopy, and X-ray diffraction
2013
Quasi-parallel precession diffraction: Alignment method for scanning transmission electron microscopes.
2018
Abstract A general method to set illuminating conditions for selectable beam convergence and probe size is presented in this work for Transmission Electron Microscopes (TEM) fitted with µs/pixel fast beam scanning control, (S)TEM, and an annular dark field detector. The case of interest of beam convergence and probe size, which enables diffraction pattern indexation, is then used as a starting point in this work to add 100 Hz precession to the beam while imaging the specimen at a fast rate and keeping the projector system in diffraction mode. The described systematic alignment method for the adjustment of beam precession on the specimen plane while scanning at fast rates is mainly based on …
A consistent path for phase determination based on transmission electron microscopy techniques and supporting simulations.
2018
This work addresses aspects for the analysis of industrial relevant materials via transmission electron microscopy (TEM). The complex phase chemistry and structural diversity of these materials require several characterization techniques to be employed simultaneously; unfortunately, different characterization techniques often lack connection to yield a complete and consistent picture. This paper describes a continuous path, starting with the acquisition of 3D diffraction data - alongside classical high-resolution imaging techniques - and linking the structural characterization of hard metal industrial samples with energy-loss fine-structure simulations, quantitative electron energy-loss (EE…
Preparation, Characterisation and Dielectric Properties of YBa2Cu3O7-δ/ Insulator-Heterostructures
1996
YBa 2 Cu 3 O 7-δ /insulator/Au-heterostructures on SrTiO 3 or LaAlO 3 substrates were prepared to study the properties of the materials SrTiO 3 , BaTiO 3 and Ceo 2 . X-ray diffraction measurements in Bragg-Brentano geometry show c-axis-oriented growth for the superconductor and the insulators SrTiO 3 and CeO 2 . Typical values for the rocking curve width of the different insulating films are between 0.4° and 0.8°. The highest breakdown fields are measured for the insulator SrTiO 3 with +37.5 kV/mm and -8.8 kV/mm. The permittivity for CeO 2 is independent of applied field and only weakly temperature dependent. This is in contrast to the perovskite type insulators, where the permittivity depe…
Complex structural contribution of the morphotropic phase boundary in Na0.5Bi0.5TiO3 - CaTiO3 system
2019
Abstract The correlation between structure and dielectric properties of lead-free (1-x)Na0.5Bi0.5TiO3 - xCaTiO3 ((1-x)NBT - xCT) polycrystalline ceramics was investigated systematically by X-ray diffraction, combined with impedance spectroscopy for dielectric characterizations. The system shows high miscibility in the entire composition range. A morphotropic phase boundary (MPB), at 0.09 ≤ x
Effect of Cu doping on Ba0.95Pb0.05TiO3 electrical properties studied by means of electrical impedance spectroscopy
2019
The ceramics of 0.95BaTiO3–0.05PbTiO3+Xwt.%CuO (X = 0.05, 0.1, 1, 3) were prepared by a solid phase reaction. The structural and morphology studies were carried out by means of X-ray diffraction te...