Search results for "Al2O3"

showing 8 items of 18 documents

Ozone-Based Atomic Layer Deposition of Al2O3 from Dimethylaluminum Chloride and Its Impact on Silicon Surface Passivation

2017

Dimethylaluminum chloride (DMACl) as an aluminum source has shown promising potential to replace more expensive and commonly used trimethylaluminum in the semiconductor industry for atomic layer deposited (ALD) thin films. Here, the Al2O3 DMACl-process is modified by replacing the common ALD oxidant, water, by ozone that offers several benefits including shorter purge time, layer-by-layer growth, and improved film adhesion. It is shown that the introduction of the ozone instead of water increases carbon and chlorine content in the Al2O3, while long ozone pulses increase the amount of interfacial hydrogen at silicon surface. These are found to be beneficial effects regarding the surface pass…

OzoneMaterials scienceHydrogenSiliconPassivationInorganic chemistryta221chemistry.chemical_element02 engineering and technology01 natural sciencesdimetyylialumiinikloridiAtomic layer depositionchemistry.chemical_compoundpuolijohteetAl2O30103 physical sciencesChlorineThin filmta216AlO010302 applied physicsta114021001 nanoscience & nanotechnologyElectronic Optical and Magnetic MaterialsozonechemistryALDdimethylaluminum chloride0210 nano-technologyLayer (electronics)silicon surface passivationAdvanced Electronic Materials
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Effect of ozone concentration on silicon surface passivation by atomic layer deposited Al2O3

2015

Abstract We study the impact of ozone-based Al2O3 Atomic Layer Deposition (ALD) on the surface passivation quality of crystalline silicon. We show that the passivation quality strongly depends on the ozone concentration: the higher ozone concentration results in lower interface defect density and thereby improved passivation. In contrast to previous studies, our results reveal that too high interface hydrogen content can be detrimental to the passivation. The interface hydrogen concentration can be optimized by the ozone-based process; however, the use of pure ozone increases the harmful carbon concentration in the film. Here we demonstrate that low carbon and optimal hydrogen concentration…

OzoneMaterials scienceSiliconPassivationAnnealing (metallurgy)Inorganic chemistryOxideGeneral Physics and Astronomychemistry.chemical_elementchemistry.chemical_compoundAtomic layer depositionAl2O3Crystalline siliconta216ta116surface passivationta114ta213Charge densitySurfaces and InterfacesGeneral ChemistryInterfaceCondensed Matter PhysicsSurfaces Coatings and FilmsozoneAtomic Layer DepositionchemistryChemical engineeringatomic layer depositioninterfaceAPPLIED SURFACE SCIENCE
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Depth profiling of Al2O3 + TiO2 nanolaminates by means of a time-of-flight energy spectrometer

2011

Atomic layer deposition (ALD) is currently a widespread method to grow conformal thin films with a sub-nm thickness control. By using ALD for nanolaminate oxides, it is possible to fine tune the electrical, optical and mechanical properties of thin films. In this study the elemental depth profiles and surface roughnesses were determined for Al2O3 + TiO2 nanolaminates with nominal single-layer thicknesses of 1, 2, 5, 10 and 20 nm and total thickness between 40 nm and 60 nm. The depth profiles were measured by means of a time-of-flight elastic recoil detection analysis (ToF-ERDA) spectrometer recently installed at the University of Jyväskylä. In TOF-E measurements 63Cu, 35Cl, 12C and 4He ions…

ToF-ERDANuclear and High Energy Physicsdepth profilingMaterials scienceSpectrometerta114business.industryAnalytical chemistryERDIonTotal thicknessElastic recoil detectionTime of flightAtomic layer depositionnanolaminateAl2O3 and TiO2ALDOptoelectronicsThin filmbusinessInstrumentationEnergy (signal processing)
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Simulations on the mechanism of CNT bundle growth upon smooth and nanostructured Ni as well as θ-Al2O3 catalysts

2011

Abstract In the current study, we have performed ab initio DFT calculations on the gradually growing 2D periodic models of capped single-wall carbon nanotubes (SW CNTs) upon their perpendicular junctions with the Ni(111) substrate, in order to understand the peculiarities of the initial stage of their growth on either smooth or nanostructured catalytic particles. Appearance of the adsorbed carbon atoms upon the substrate follows from the dissociation of CVD hydrocarbon molecules, e.g., CH4: (CH4)ads → (CH)ads+3Hads and (CH)ads → Cads+Hads. (Since the effective growth of CNTs upon Ni nanoparticles occur inside the nanopores of amorphous alumina, we have also simulated analogous surface react…

adsorption and dissociation of ch4Materials scienceQC1-999General Physics and AstronomyNanoparticleNanotechnology02 engineering and technologyCarbon nanotubeflat and nanostructured surfaces of ni and θ-al2o3 catalystsarcmchair and zigzag-type chiralities01 natural sciencesdft calculationsDissociation (chemistry)Catalysislaw.inventionNanoclusterslaw0103 physical sciencesMoleculemechanism of cnt growth010306 general physicsbundles of single-wall cntsPhysics021001 nanoscience & nanotechnologyAmorphous solidChemical bondChemical engineeringcnt-ni junction0210 nano-technologyCentral European Journal of Physics
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Ozone-Based Atomic Layer Deposition of Al2O3 from Dimethylaluminum Chloride and Its Impact on Silicon Surface Passivation

2017

Dimethylaluminum chloride (DMACl) as an aluminum source has shown promising potential to replace more expensive and commonly used trimethylaluminum in the semiconductor industry for atomic layer deposited (ALD) thin films. Here, the Al2O3 DMACl-process is modified by replacing the common ALD oxidant, water, by ozone that offers several benefits including shorter purge time, layer-by-layer growth, and improved film adhesion. It is shown that the introduction of the ozone instead of water increases carbon and chlorine content in the Al2O3, while long ozone pulses increase the amount of interfacial hydrogen at silicon surface. These are found to be beneficial effects regarding the surface pass…

dimetyylialumiinikloridiALDpuolijohteetAl2O3dimethylaluminum chlorideotsonisilicon surface passivation
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Re-Evaluation of Chromium Doped Alumina for Dosimetric Applications

2021

Financial support provided by Scientific Research “Luminescence Mechanisms and Dosimeter Properties in Prospective Nitrides and Oxides Using TL and OSL Methods” LZP FLPP No. LZP-2018/1-0361 implemented at the Institute of Solid State Physics, University of Latvia is greatly acknowledged. The Institute of Solid State Physics, University of Latvia as the Centre of Excellence has received funding from the European Union’s Horizon 2020 Framework Program H2020-WIDESPREAD-01-2016-2017-TeamingPhase2 under grant agreement No. 739508, project CAMART².

dosimetryPhysicsQC1-999AluminaGeneral EngineeringGeneral Physics and Astronomy02 engineering and technology021001 nanoscience & nanotechnologyEngineering physicsaluminaal2o3:cr3. Good health030218 nuclear medicine & medical imaging03 medical and health sciences0302 clinical medicine:NATURAL SCIENCES:Physics [Research Subject Categories]media_common.cataloged_instancesol-gelCr [Al2O3]chromiumEuropean union0210 nano-technologymedia_commonLatvian Journal of Physics and Technical Sciences
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Al2O3 ALD films grown using TMA + rare isotope 2H216O and 1H218O precursors

2021

In this work hydrogen and oxygen migration and exchange reactions in the atomic layer deposited (ALD) Al2O3 thin films were studied together with hydrogen incorporation by varying deposition parameters. Al2O3 films deposited at low temperatures can contain more than 20 at. % of hydrogen. Both higher temperature and longer purge length decrease the hydrogen and carbon concentrations significantly. In order to track the hydrogen and oxygen movement in the films, heavy water (2H216O) and oxygen-18 enriched water (1H218O) were used as precursors in combination with trimethylaluminium (TMA). Different isotopes of the same element were quantified by means of time-of-flight elastic recoil detectio…

kylmäfysiikkaALDvetyAl2O3alumiinioksidilow temperatureTMAatomikerroskasvatusohutkalvotheavy waterhydrogen migration
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Incorporation mechanism of colloidal TiO2 nanoparticles and their effect on properties of coatings grown on 7075 Al alloy from silicate-based solutio…

2021

Plasma electrolytic oxidation (PEO) was applied using a pulsed unipolar waveform to produce Al2O3-TiO2 composite coatings from sol electrolytic solutions containing colloidal TiO2 nanoparticles. The sol solutions were produced by dissolving 1, 3, and 5 g/L of potassium titanyl oxalate (PTO) in a silicate solution. Scanning electron microscopy, energy dispersive spectrometry, X-ray diffraction, and Raman spectroscopy were applied to characterizing the coatings. Corrosion behavior of the coatings was investigated using polarization and impedance techniques. The results indicated that TiO2 enters the coating through all types of micro-discharging and is doped into the alumina phase. The higher…

plasma electrolytic oxidationcorrosion resistanceSettore ING-IND/23 - Chimica Fisica ApplicataTiO2 coatingMaterials ChemistryMetals and AlloysminusAl2O3&amppotassium titanyl oxalateAl alloyGeotechnical Engineering and Engineering GeologyCondensed Matter PhysicsTransactions of Nonferrous Metals Society of China
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