Search results for "Atomic Force"

showing 10 items of 308 documents

Magnetoelectric coupling driven by inverse magnetostriction in multiferroic BiMn3Mn4O12

2013

By means of neutron powder diffraction, we investigated the effect of the polar Bi$^{3+}$ ion on the magnetic ordering of the Mn$^{3+}$ ions in BiMn$_3$Mn$_4$O$_{12}$, the counterpart with \textit{quadruple} perovskite structure of the \textit{simple} perovskite BiMnO$_3$. The data are consistent with a \textit{noncentrosymmetric} spacegroup $Im$ which contrasts the \textit{centrosymmetric} one $I2/m$ previously reported for the isovalent and isomorphic compound LaMn$_3$Mn$_4$O$_{12}$, which gives evidence of a Bi$^{3+}$-induced polarization of the lattice. At low temperature, the two Mn$^{3+}$ sublattices of the $A'$ and $B$ sites order antiferromagnetically (AFM) in an independent manner …

Neutron powder diffractionMAGNETIC-STRUCTURESPEROVSKITEGeneral Physics and AstronomyDefect free02 engineering and technologyDIFFRACTION01 natural sciencesIonLattice (order)BIMNO30103 physical sciencesMultiferroicsCRYSTAL-STRUCTURE010306 general physicsPerovskite (structure)PhysicsAtomic force microscopy021001 nanoscience & nanotechnologyPOLYMORPHISMCrystallographyROOM-TEMPERATUREPolarHIGH-PRESSURE SYNTHESISBIMN7O12[PHYS.COND.CM-SCE]Physics [physics]/Condensed Matter [cond-mat]/Strongly Correlated Electrons [cond-mat.str-el]0210 nano-technologyTRANSITION
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Some experimental issues of AFM tip blind estimation. The effect of noise and resolution

2006

The convolution of tip shape on sample topography can introduce significant inaccuracy in an AFM image, when the tip radius is comparable to the typical dimension of the sample features to be observed. The blind estimation method allows one to obtain information on the AFM tip through an unknown characterizer sample and thus to perform the deconvolution of the tip shape from an image. When applying the blind estimation method to determine the AFM tip shape, some apparently trivial issues relating to the experimental operating parameters must be taken into account. In this paper, the effects of the operating parameters, e.g., sampling intervals (resolution) and instrumental noise, have been …

Noise (signal processing)Applied MathematicsAcousticsResolution (electron density)Sampling (statistics)atomic force microscopy tip characterization blind estimationRadiusSample (graphics)ConvolutionDimension (vector space)StatisticsDeconvolutionInstrumentationEngineering (miscellaneous)Mathematics
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Application of atomic and nuclear techniques to the study of inhomogeneities in electrodeposited α-particle sources

2002

Three α-particle sources made by different methods of electrodeposition were analysed using α-particle spectrometry, Rutherford backscattering (RBS), and atomic force microscopy (AFM) on several surface zones. The thickness and homogeneity of these sources was studied using RBS, and the results were analysed jointly with those obtained with α-particle spectrometry and AFM techniques. The comparison of the electrodeposition methods showed that the most homogeneous electrodeposited zones corresponded to the source made with a stirring cathode.

Nuclear and High Energy PhysicsChemistrylawHomogeneousAtomic force microscopyHomogeneity (physics)Analytical chemistryMass spectrometryInstrumentationα particlesCathodelaw.inventionNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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Nanostructuring and strengthening of LiF crystals by swift heavy ions: AFM, XRD and nanoindentation study

2012

Abstract Modifications of the structure and micromechanical properties of LiF crystals under high-fluence irradiation (10 11 –10 13  ions cm −2 ) with swift C, Ti, Au and U ions of the specific energy of 11.1 MeV/u have been studied. In the case of heavy ions (U, Au), the AFM and SEM results reveal the bulk nanostructure consisting of columnar grains with nano-scale dimensions (50–100 nm). For lighter C ions the structure enriched with prismatic dislocation loops has been observed. High-resolution XRD reciprocal space maps for nano-structured LiF expose a mosaic-type structure with low-angle boundaries between grains.

Nuclear and High Energy PhysicsCrystallographyReciprocal latticeMaterials scienceNanostructureAtomic force microscopySpecific energyIrradiationNanoindentationDislocationInstrumentationIonNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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MeV–GeV ion induced dislocation loops in LiF crystals

2014

Abstract Formation of prismatic dislocation loops and evolution of dislocation structure in LiF crystals irradiated with swift 238U and 36S ions of specific energy 11 MeV/u at fluences up to 1013 ions cm−2 has been investigated using chemical etching and AFM. It has been shown that prismatic dislocations are formed in the stage of track overlapping above threshold fluences Φ ≈ 109 U cm−2 and Φ ≈ 1010 S cm−2. The diameter of dislocation loops reaches 600–1000 nm for 238U ions and 200 nm for 36S ions. The dislocations created by 238U ions are arranged in rows along the direction of ion beam, whereas 36S ions create freely distributed dislocation loops each of them being oriented along the ion…

Nuclear and High Energy PhysicsMaterials scienceIon beamAtomic force microscopyHardening (metallurgy)Specific energyIrradiationDislocationAtomic physicsInstrumentationIsotropic etchingIonNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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Smooth crack-free targets for nuclear applications produced by molecular plating

2013

The production process of smooth and crack-free targets by means of constant current electrolysis in organic media, commonly known as molecular plating, was optimized. Using a Nd salt, i.e., [Nd(NO3)(3)center dot 6H(2)O], as model electrolyte several constant current density electrolysis experiments were carried out to investigate the effects of different parameters, namely the plating solvent (isopropanol and isobutanol mixed together, pyridine, and N,N-dimethylformamide), the electrolyte concentration (0.11, 0.22, 0.44 mM), the applied current density (0.17, 0.3, 0.7, and 1.3 mA/cm(2)), and the surface roughness of the deposition substrates (12 and 24 nm). Different environments (air and …

Nuclear and High Energy PhysicsspectroscopyScanning electron microscopeX-ray photoelectronAnalytical chemistrychemistry.chemical_elementElectrolytegamma-ray spectroscopy; Atomic force microscopy (AFM); Molecular plating; Neodymium; Smooth crack-free targets; X-ray photoelectron spectroscopy (XPS)Neodymium530law.inventionSmooth crack-free targetsNuclear magnetic resonanceX-ray photoelectron spectroscopylawSurface roughnessgamma-raySpectroscopyInstrumentationPhysicsNeodymiumElectrolysisspectroscopy (XPS)X-ray photoelectron spectroscopy (XPS)Molecular platingchemistrygamma-ray spectroscopyAtomic force microscopy (AFM)Current density
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Mechanical and electroconductive properties of spatially distributed double stranded DNA arrays on Au (111)

2008

Abstract Conductive AFM was used to investigate electroconductivity through 10 nm long double stranded DNA molecules in mixed monolayers of thioalkylated-DNA and mercaptohexanol (MCH) on Au (111) surface. The distribution of DNA molecules on the surface was analyzed by tapping mode AFM. Measurements performed in lift mode confirmed that the DNA molecules protrude from the surface rather than lie horizontally adsorbed on the interface. The optimal conductivity measurement time, which is shorter than the mechanical relaxation time of oligonucleotide duplexes, was determined. It was concluded that oligonucleotide duplexes have a resistance of the order of ~ 2 Ω ⁎ m at 1 V.

OligonucleotideMetals and AlloysAnalytical chemistrySelf-assembled monolayerSurfaces and InterfacesConductive atomic force microscopyConductivitySurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsCrystallographychemistry.chemical_compoundAdsorptionchemistryMonolayerMaterials ChemistryMoleculeDNAThin Solid Films
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Characterization of the CtsR stress response regulon in Lactobacillus plantarum.

2010

ABSTRACT Lactobacillus plantarum ctsR was characterized. ctsR was found to be cotranscribed with clpC and induced in response to various abiotic stresses. ctsR deletion conferred a heat-sensitive phenotype with peculiar cell morphological features. The transcriptional pattern of putative CtsR regulon genes was examined in the Δ ctsR mutant. Direct CtsR-dependent regulation was demonstrated by DNA-binding assays using recombinant CtsR and the promoters of the ctsR - clpC operon and hsp1 .

OperonMutantBiology[ SDV.MP.BAC ] Life Sciences [q-bio]/Microbiology and Parasitology/BacteriologyMicroscopy Atomic ForceMicrobiologyRegulonMicrobiologylaw.invention03 medical and health sciencesBacterial ProteinslawGene RegulationPromoter Regions GeneticMolecular BiologyGeneHeat-Shock Proteins030304 developmental biologyGenetics0303 health sciences030306 microbiologyReverse Transcriptase Polymerase Chain ReactionTemperaturePromoterGene Expression Regulation Bacterialbiology.organism_classificationPhenotype[SDV.MP.BAC]Life Sciences [q-bio]/Microbiology and Parasitology/BacteriologyRepressor ProteinsRegulonRecombinant DNALactobacillus plantarumProtein BindingLactobacillus plantarum
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Structural, electronic, and electrical properties of an Undoped n-Type CdO thin film with high electron concentration

2014

Transparent conducting metal oxides (TCOs) combine the properties of optical transparency in the visible region with a high electrical conductivity. They are a critical component as the window electrode in liquid crystal and electroluminescent display devices, as well as in many designs of solar cells now under development. Sn-doped In2O3 is currently the most important TCO, but it suffers from some drawbacks. These include the high cost of indium, weak optical absorption in the blue-green region, as well as chemical instability that leads to corrosion phenomena in organic light-emitting devices. Indium tin oxide (ITO) films are also brittle and of relatively low durability. A number of oth…

Organic light-emitting devices Optical propertiesMaterials scienceDisplay deviceElectroluminescent display deviceHigh electron concentrationCdO; semiconductor; TCOchemistry.chemical_elementChemical vapor depositionAtomic force microscopyElectric conductivityElectrical resistivity and conductivityChemical vapor depositionLight absorptionThin filmPhysical and Theoretical ChemistryThin filmCdOHigh electrical conductivitybusiness.industryDegenerate semiconductorFree electron concentrationsemiconductorSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsIndium tin oxideElectroluminescent displayPhotoelectron spectroscopyGeneral EnergychemistryLiquid crystalTCOTinElectrodeOptoelectronicsX ray diffraction Conducting metal oxidebusinessTinLuminescence measurementIndium
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Formation and evolution of self-organized Au nanorings on indium-tin-oxide surface

2011

This work reports on the formation of Au nanoclusters and on their evolution in nanoring structures on indium-tin-oxide surface by sputtering deposition and annealing processes. The quantification of the characteristics of the nanorings (surface density, depth, height, and width) is performed by atomic force microscopy. The possibility to control these characteristics by tuning annealing temperature and time is demonstrated establishing relations which allow to set the process parameters to obtain nanostructures of desired morphological properties for various technological applications. © 2011 American Institute of Physics.

PLASMON RESONANCEMaterials scienceNanostructureNanoringPhysics and Astronomy (miscellaneous)Annealing (metallurgy)NanotechnologySputter depositionAu; Nanoring; Atomic force microscopySettore ING-INF/01 - ElettronicaIndium tin oxideNanoclustersAtomic force microscopyNanolithographyITO THIN-FILMSSputteringGOLD NANOPARTICLESAuNanoring
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